| 1 |
AIPES beamline at Indus-1 (RJC) |
SR source: 10-200 eV, TGM-2600 toroidal grating monochromator, EA 125 1800 hemispherical analyzer, Sample preparation chamber, Argon ion gun, A diamond file, X-ray sources Mg K & Al K, Temperature: 725-77K |
bulk, powder, thin films |
| 2 |
Pulsed Laser Deposition (RJC) |
KrF Excimer Laser source (248 nm), Rep. rate: 50 Hz Max, Pulse duration: 20 ns. |
1x1 cm2 substrate (Max) |
| 3 |
PLD-Laser MBE (RJC) |
|
|
| 4 |
Nabertherm Furnace (1500 C) (RJC) |
|
|
| 5 |
Table-top XRD (RJC) |
Geometry theta-Theta; accuracy ± 0.02° throughout the entire measuring range Achievable peak width < 0.05° X-ray wavelengths Cu, standard ceramic sealed tube X-ray generation 30 kV / 10 mA Detectors 1-dimensional LYNXEYE0.002 |
bulk, powder, thin films |
| 6 |
SQUID-VSM for Thin Films (RJC) |
|
|
| 7 |
Diff. Scan. Calorimeter (Mettler-Toledo) (RJC) |
|
|
| 8 |
(Magneto-dielectric-setup) Broadband Impedance Analyzer(Novo-Control) (RJC) |
|
|
| 9 |
P-E Loop Tracer (Radiant Technologies) (RJC) |
|
|
| 10 |
Depth profilometer (RJC) |
|
|
| 11 |
Mettler-Toledo AG Semi-Microbalance (RJC) |
|
|
