| 1 |
Piezoelectric coefficient (d33) and dielectric measurements (DKS) |
d33 range : 1-2000 pC/N , Temperature range: RT, Force frequency: 110 Hz amplitude 0.25N; Dielectric measurements: Temperature range : 78K-525K(liq. N2), RT-800K(HT setup) , Frequency range : 4Hz-1MHz |
For dielectric measurement electroded pellet & single crystal is required and Poled electroded pellet is required for d33 measurement. |
| 2 |
Low-Temperature High-magnetic field XRD ( LTHM-XRD) (AY-DK) |
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| 3 |
Home developed resistivity and thermopower measurements (DKS) |
Resistivity Measurement- Temperature range: 78K-400 K(liq. N2); Thermopower measurement- 78K-320K |
Resistivity Measurement: Thin film, single crystal, pellet(bulk) is required; Thermopower Measurement : Thin film, wire, single crystal, pellet(bulk). |
| 4 |
14-Tesla VSM (DKS) |
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| 5 |
Grazing Incidence X-ray Scattering Beamline (BL-13) |
For X-ray scattering (XRR and XRD) measurements VISIT - https://www.rrcat.gov.in/technology/accel/srul/beamlines/gixs_bl13.html |
Please contact at dileep.esrf @gmail.com for thin films and multilayers (polycrystalline, Amorphous and Epitaxial) and contact at shukladk@gmail.com for powder, low temperature and single crystals XRD |
